Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-04-25
2010-12-14
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07853901
ABSTRACT:
A method for producing a family of digital integrated circuit designs, where the family has a highest level design and at least one lower level design. The highest level design is first produced. Then, in a programmed computing system without user intervention, the highest level design is automatically processed to selectively remove at least one predetermined metal layer. A closest remaining overlying layer to the at least one removed metal layer is automatically mapped to a closest remaining underlying layer to the at least one removed metal layer, thereby producing the at least one lower level design.
REFERENCES:
patent: 2003/0067075 (2003-04-01), Fukasawa
patent: 2005/0198608 (2005-09-01), Brown
patent: 2006/0165813 (2006-07-01), Dangel et al.
patent: 2008/0201685 (2008-08-01), Selvaraj
patent: 2009/0134909 (2009-05-01), Madurawe
Blinne Richard D.
Lakshmanan Viswanathan
O'Brien Thomas R.
Chiang Jack
LSI Corporation
Luedeka Neely & Graham P.C.
Parihar Suchin
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