Ultrasonic detection of extended flaws

Measuring and testing – Vibration – By mechanical waves

Patent

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Details

73620, 73623, G01N 2904

Patent

active

044413696

ABSTRACT:
An extended flaw in a material is located in two or three dimensions by propagating ultrasonic energy in a predetermined direction in the material and logging receiving transducer positions and ranges at which individual facets on the surface of the flaw produce maximum amplitude ultrasonic returns. The positions of all of the individual facets in the material are calculated from the predetermined direction, receiving transducer positions and the corresponding ranges. The locations of the individual facets outline the extended flaw.

REFERENCES:
patent: 4054053 (1977-10-01), Yamamoto et al.
patent: 4226122 (1980-10-01), Lund et al.

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