Ultra-sensitive detection techniques

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Physical deformation

Reexamination Certificate

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C438S048000, C977S724000

Reexamination Certificate

active

07888753

ABSTRACT:
Techniques for ultra-sensitive detection are provided. In one aspect, a detection device is provided. The detection device comprises a source; a drain; a nanowire comprising a semiconductor material having a first end clamped to the source and a second end clamped to the drain and suspended freely therebetween; and a gate in close proximity to the nanowire.

REFERENCES:
patent: 6183097 (2001-02-01), Saif et al.
patent: 7652342 (2010-01-01), Bertin
patent: 2007/0230241 (2007-10-01), Bockrath
K.L. Ekinci et al., Ultimate limits to inertial mass sensing based upon nanoelectromechanical systems, J. Appl. Phys. 95, 2682-2689 (2004).
K.L. Ekinci et al., Ultrasensitive nanoelectromechanical mass detection, Appl. Phys. Lett. 84, 4469-4471 (2004).

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