Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Patent
1977-12-30
1979-12-25
Hoffman, James R.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
427 96, 427407R, 430296, 430325, B05D 136, G03C 174
Patent
active
041806042
ABSTRACT:
A resist mask comprising two layers of resist, one of which is saturated with a dilutant which does not dissolve the other. In one embodiment, the two layers of resist are applied upon a substrate, the first layer of which is more soluble in a developer. The second layer is said saturated resist and the first layer is non-saturated. This composite is preferaly used to form a relief mask with recessed sidewalls used in lift-off processes.
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Feng Bai-Cwo
Feng George C.
Bunnell David M.
Galvin Thomas F.
Hoffman James R.
International Business Machines - Corporation
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