Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device
Reexamination Certificate
2005-05-13
2008-12-16
Nhu, David (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
C257S288000, C257S196000, C257S310000, C257SE21438, C257SE21637, C257SE21639, C257SE21703, C257SE27112, C257SE29255
Reexamination Certificate
active
07465976
ABSTRACT:
The present invention relates to a Tunnel Field Effect Transistor (TFET). which utilizes angle implantation and amorphization to form asymmetric source and drain regions. The IFET further includes a silicon germanium alloy epitaxial source region with a conductivity opposite that of the drain.
REFERENCES:
patent: 4583105 (1986-04-01), Rosenberg
patent: 4675711 (1987-06-01), Harder et al.
patent: 6214679 (2001-04-01), Murthy et al.
patent: 6797983 (2004-09-01), Chen et al.
patent: 6887762 (2005-05-01), Murthy et al.
patent: 6949482 (2005-09-01), Murthy et al.
patent: 6995054 (2006-02-01), Oda et al.
patent: 7026232 (2006-04-01), Koontz et al.
patent: 2003/0143768 (2003-07-01), Chen et al.
patent: 2005/0285213 (2005-12-01), Datta et al.
Brask Justin K.
Chau Robert S.
Datta Suman
Dewey Gilbert
Jin Ben
Blakely , Sokoloff, Taylor & Zafman LLP
Intel Corporation
Nhu David
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