Tunneling field effect transistor using angled implants for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device

Reexamination Certificate

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C257S288000, C257S196000, C257S310000, C257SE21438, C257SE21637, C257SE21639, C257SE21703, C257SE27112, C257SE29255

Reexamination Certificate

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07465976

ABSTRACT:
The present invention relates to a Tunnel Field Effect Transistor (TFET). which utilizes angle implantation and amorphization to form asymmetric source and drain regions. The IFET further includes a silicon germanium alloy epitaxial source region with a conductivity opposite that of the drain.

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patent: 2003/0143768 (2003-07-01), Chen et al.
patent: 2005/0285213 (2005-12-01), Datta et al.

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