Tungsten local interconnect, using a silicon nitride capped self

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257413, 257752, 257763, H01L 2976

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active

059200987

ABSTRACT:
MOSFET devices, using a local interconnect structure, and silicon nitride capped, self-aligned contact openings, have been developed. The process features the creation of self-aligned contact openings, exposing specific source and drain regions. After deposition of a composite insulator layer, a second opening is formed in the composite insulator layer, again exposing various elements including the previously opened, specific source and drain regions. The local tungsten interconnect structure fills the second opening, contacts, as well as interconnects, the specific source and drain regions.

REFERENCES:
patent: 5075762 (1991-12-01), Kondo et al.
patent: 5223456 (1993-06-01), Malwah
patent: 5391520 (1995-02-01), Chen et al.
patent: 5451543 (1995-09-01), Woo et al.
patent: 5451545 (1995-09-01), Ramaswami et al.
patent: 5480837 (1996-01-01), Liaw et al.
patent: 5483104 (1996-01-01), Godinho et al.
patent: 5677563 (1997-10-01), Cronin et al.
patent: 5814862 (1998-09-01), Sung et al.
patent: 5814886 (1998-09-01), Mano
patent: 5879986 (1999-03-01), Sung
"Self-Aligned Contact Technology", IBM Technical Disclosure Bulletin, vol. 36, No. 4, Apr. 1993, pp. 445-446.

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