Measuring and testing – Testing of apparatus
Patent
1989-01-31
1991-08-13
Noland, Tom
Measuring and testing
Testing of apparatus
73 7, 324454, 360 31, G01M 1900
Patent
active
050386255
ABSTRACT:
A tribological head-disk interface testing system for testing commercial head-disk assemblies in an accelerated fashion to determine wear life, the system comprising an interface stress device disposed on a disk with a wear tester, the interface stress device having a semispherical crystal pin mounted on a slider. Piezoelectric crystals are mounted on the slider.
REFERENCES:
patent: 4416144 (1983-11-01), Chen et al.
patent: 4692832 (1987-09-01), Bandara et al.
patent: 4724392 (1988-02-01), Bandara et al.
patent: 4795981 (1989-01-01), Ertingshausen et al.
patent: 4872071 (1989-10-01), Easton et al.
Heller III Edward P.
McCarthy Bill D.
Noland Tom
Seagate Technology Inc.
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