Trench MOS structure

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29136, C257SE29258

Reexamination Certificate

active

07629647

ABSTRACT:
A semiconductor device has a trench (42) adjacent to a cell (18). The cell includes source and drain contact regions (26, 28), and a central body (40) of opposite conductivity type. The device is bidirectional and controls current in either direction with a relatively low on-resistance. Preferred embodiments include potential plates (60) that act together with source and drain drift regions (30, 32) to create a RESURF effect.

REFERENCES:
patent: 4839309 (1989-06-01), Easter et al.
patent: 5142640 (1992-08-01), Iwamatsu
patent: 5349224 (1994-09-01), Gilbert et al.
patent: 5349225 (1994-09-01), Redwine et al.
patent: 5359221 (1994-10-01), Miyamoto et al.
patent: 6201278 (2001-03-01), Gardner et al.
patent: 6316807 (2001-11-01), Fujishima et al.
patent: 6452231 (2002-09-01), Nakagawa et al.
patent: 6515348 (2003-02-01), Hueting et al.
patent: 6534823 (2003-03-01), Hueting et al.
patent: 6555872 (2003-04-01), Dennen
patent: 2001/0045599 (2001-11-01), Heuting et al.
patent: 0 735 589 (1996-10-01), None
patent: WO 99/43029 (1999-08-01), None

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