Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-07
2006-03-07
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S014000
Reexamination Certificate
active
07010768
ABSTRACT:
A method, apparatus, system, and signal-bearing medium that in an embodiment select a subset of transmission line models based on bounding electrical criteria. The bounding electrical criteria may include combinations of maximum and minimum values and in an embodiment may also include nominal values. Models that meet the bounding electrical criteria may be used in modeling the transmission line while models that do not meet the bounding electrical criteria are not used.
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Dahlen Paul Eric
Gravrok Roger John
Heckmann David Loren
Maxson Mark Owen
Doan Nghia M.
Gamon Owen J.
International Business Machines - Corporation
Whitmore Stacy A.
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