Transmission electron microscope employing sequential pixel acqu

Details Transmission electron microscope employing sequential pixel acqu Transmission electron microscope employing sequential pixel acqu

1982-04-02

1983-08-16

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

Electron microscope type

250397, G01N 2300

Patent

active

043993605

ABSTRACT:
A standard Transmission Electron Microscope is modified to include electrostatic deflection plates for deflecting the image of the specimen across an aperture plate. The electrons passing through the aperture plate are detected and converted into image pixels for either instantaneous display or for further conversion into digital form for subsequent storage of the image.

REFERENCES:
patent: 2372422 (1945-03-01), Hillier
patent: 3191028 (1965-06-01), Crewe
patent: 3795809 (1974-03-01), Takashima
patent: 4044254 (1977-08-01), Krisch et al.
patent: 4316087 (1982-02-01), Yanaka et al.

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