Translation generation for a mask pattern

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000

Reexamination Certificate

active

11035928

ABSTRACT:
Generation of one or more translations is described. The generated translations may be applied to a mask pattern so that the pattern may be moved to cover one or more mask defects in part or in totality.

REFERENCES:
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patent: 6765673 (2004-07-01), Higashikawa
patent: 2004/0009408 (2004-01-01), Fisch et al.
patent: 2004/0124174 (2004-07-01), Yan et al.
patent: 2004/0126670 (2004-07-01), Liang et al.
patent: 2004/0151988 (2004-08-01), Silverman

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