Transition metal thin film forming method

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21170

Reexamination Certificate

active

07361595

ABSTRACT:
A semiconductor substrate is placed in a predetermined processing vessel, and oxygen gas activated by, e.g. conversion into a plasma is supplied onto an insulating film. The surfaces of an interlevel insulating film and insulating film are exposed to the activated oxygen gas. After that, a transition metal film, e.g. a ruthenium film, is formed by CVD.

REFERENCES:
patent: 5620925 (1997-04-01), Nakata et al.
patent: 6271131 (2001-08-01), Uhlenbrock et al.
Park S-E et al: “A Novel Process to Improve the Suface Roughness of RU02 Film Deposited by Metallorganic Chemical Vapor Deposition”, Electrochemical and Solid-State Letters, IEEE Service Center, Piscataway, NJ, US, vol. 1, No. 6, Dec. 1, 1998. pp. 262-264, XP000786831 ISSN: 109-0062.
Kwon J-H et al: “Preparation of Pt thin films deposited by metalorganic chemical vapor deposition for ferroelectic thin films”, Thin Solid Films, Elsevier-Sequoia S.A. Lausanne, CH, vol. 303, No. 1-2, Jul. 15, 1997, pp. 136-142, XP004087624 ISSN: 0040-6090.
Lee J-H et al: “Effects of hydrogen plasma pretreatment on characteristic of copper film deposited by remote plasma CVD using (hfac)Cu(TMVS)”, Thin Solid Films, Elsevier-Sequoia S.A. Lausanne, CH, vol. 375, No. 1-2, Oct. 31, 2000, pp. 132-136, XP 004237519 ISSN: 0040-6090.
“Deposit and Etch Technique for Making Smooth, Low Resistivity Tungsten Films”, Research Disclosurek, Kenneth Mason Publicationsk, HAMPSHIREK, GB, No. 305, Sep. 1, 1989, p. 633 XP000070496 ISSN: 0374-4353.
Saito Y et al: “Tungsten Chemical Vapor Deposition on Silicon and Silicon Dioxide With Plasma Excited Hydrogen”, Japanese Journal of Applied Physics, Publication Office Japanese Journal of Applied Phnysics. Tokyo, JP, vol. 33, No. 7B, PART 1, Jul. 1, 1994, pp. 4413-4416, XP000595755 ISSN: 0021-4922.
Nabatame T et al: “Properties of Ruthenium Films Prepared by Liquid Source Metalorganic Chemical Vapor Deposition Using RU(ETCP)2 With Tetrahydrofuran Solvent”, Japanese Journal of Applied Physics, Publication Office Japanese Journal of Applied Physics. Tokyo, JP, vol. 39, No. 11B, PART 2, Nov. 15, 2000, pp. L1188-L1190, XP001020539 ISSN: 0021-4922.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Transition metal thin film forming method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Transition metal thin film forming method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Transition metal thin film forming method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2787487

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.