Active solid-state devices (e.g. – transistors – solid-state diode – Specified wide band gap semiconductor material other than... – Diamond or silicon carbide
Reexamination Certificate
2006-11-28
2006-11-28
Pert, Evan (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Specified wide band gap semiconductor material other than...
Diamond or silicon carbide
C257S315000, C257S316000, C257SE29129, C257SE29300
Reexamination Certificate
active
07141824
ABSTRACT:
A SiC material composition is selected to establish the barrier energy between the SIC gate and a gate insulator. Various embodiments of selected SiC material composition include a memory application, such as a flash EEPROM, and a light detector or imaging application.
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Ahn Kie Y.
Forbes Leonard
Mandala Jr. Victor A.
Micro)n Technology, Inc.
Pert Evan
Schwegman Lundberg Woessner & Kluth P.A.
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