Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-10-09
2007-10-09
Crane, Sara (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S296000, C257S390000
Reexamination Certificate
active
11024935
ABSTRACT:
A transistor structure having source/drain regions arranged in a horizontal plane along an x axis has a recess structure, which separates the two source/drain regions from one another and increases the effective channel length Leffof the transistor structure. A vertical gate electrode with respect to the horizontal plane extends along the x axis and in this case encloses an active zone of the transistor structure from two sides or completely. The effective channel width Weffis dependent on the depth to which the gate electrode is formed. A memory cell having a selection transistor in accordance with the transistor structure has both a low leakage current and a good switching behavior. By a suitable integration concept, the transistor structure is integrated into a memory cell array of a DRAM having hole trench capacitors or stacked capacitors.
REFERENCES:
patent: 5920088 (1999-07-01), Augusto
patent: 5945707 (1999-08-01), Bronner et al.
patent: 6977404 (2005-12-01), Katsumata et al.
patent: 2001/0010957 (2001-08-01), Forbes et al.
patent: 2005/0127421 (2005-06-01), Seidl et al.
Crane Sara
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Matthews Colleen
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