Transistor, memory cell array and method of manufacturing a...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE27091

Reexamination Certificate

active

07612406

ABSTRACT:
A transistor includes a first and second source/drain regions, a channel connecting the first and second source/drain regions, and a gate electrode to control an electrical current flowing in the channel. The gate electrode is disposed in a gate groove, the gate groove being defined in a top surface of a semiconductor substrate. The first and second source/drain regions extend at least to a depth d1, the depth d1being measured from the top surface of the substrate. A top surface of the gate electrode is disposed beneath the top surface of the semiconductor substrate. A top surface of the gate electrode is disposed at a depth d2which is less than the depth d1, the depth d2being measured from the substrate surface.

REFERENCES:
patent: 5502320 (1996-03-01), Yamada
patent: 6063669 (2000-05-01), Takaishi
patent: 7034408 (2006-04-01), Schloesser
patent: 7129130 (2006-10-01), Adkisson et al.
patent: 7393749 (2008-07-01), Yilmaz et al.
patent: 2001/0028084 (2001-10-01), Mo
patent: 2006/0113588 (2006-06-01), Wu
patent: 2006/0120129 (2006-06-01), Schloesser
patent: 2006/0244024 (2006-11-01), Manger
patent: 19928781 (2000-07-01), None
patent: 1003219 (2000-05-01), None

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