Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2007-04-17
2007-04-17
Kebede, Brook (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S758000, C257SE21595
Reexamination Certificate
active
11282257
ABSTRACT:
A modifiable circuit structure and its method of formation are disclosed. The modifiable circuit structure electrically couples one portion of an interconnect with another portion of the interconnect through vias disposed in a dielectric layer. The combination of the modifiable circuit structure, the interconnect portions, and the vias provide a signal path between transistors in an integrated circuit. In one embodiment the modifiable circuit structure is a polysilicon feature formed over regions of a semiconductor substrate. In an alternative embodiment, the modifiable circuit structure is a diffusion region formed in regions the semiconductor substrate.
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Livengood Richard H.
Slawecki Darren
Blakely , Sokoloff, Taylor & Zafman LLP
Kebede Brook
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