Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – With lattice constant mismatch
Reexamination Certificate
2007-03-29
2009-08-04
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
With lattice constant mismatch
C257S194000, C257S288000, C257SE29193, C257SE29251
Reexamination Certificate
active
07569869
ABSTRACT:
A transistor structure and a system including the transistor structure. The transistor structure comprises: a substrate including a first layer comprising a first crystalline material; a tensile strained channel formed on a surface of the first layer and comprising a second crystalline material having a lattice spacing that is smaller than a lattice spacing of the first crystalline material; a metal gate on the substrate; a pair of sidewall spacers on opposite sides of the metal gate; and a source region and a drain region on opposite sides of the metal gate adjacent a corresponding one of the sidewall spacers.
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Chau Robert S.
Datta Suman
Jin Been-Yih
Kavalieros Jack T.
Radosavlievic Marko
Intel Corporation
Intel Corporation
Lane Scott M.
Nguyen Duy T
Pham Thanh V
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