Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-11-10
2008-08-05
Prenty, Mark (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S257000
Reexamination Certificate
active
07408211
ABSTRACT:
A transfer transistor of a CMOS image sensor is described, including a substrate of a first type, a gate dielectric layer on the substrate, a gate on the gate dielectric layer, a first doped region of the first type, a buried channel region of the first or second type, a second doped region of the first type, and source/drain regions of the second type. The first doped region is in the substrate directly under the gate dielectric layer under the gate, the buried channel region is in the substrate under the first doped region, and the second doped region is in the substrate under the buried channel region. The source/drain regions are in the substrate beside the gate.
REFERENCES:
patent: 6630701 (2003-10-01), Rhodes
patent: 7214974 (2007-05-01), Shin
Jianq Chyun IP Office
Prenty Mark
United Microelectronics Corp.
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