Trace module for integrated circuit devices

Details Trace module for integrated circuit devices Trace module for integrated circuit devices

2009-08-27

2011-10-18

McCarthy, Christopher (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

08042007

ABSTRACT:
A method of capturing trace data can include storing trace data from a circuit as entries within memory slots of a trace buffer. Responsive to detecting a first trigger event, a trigger bit and a time marker bit within a first trigger event entry are set, wherein the trigger bit and the time marker bit are correlated with the first trigger event. A capture region within the trace buffer having a defined range can be determined. A first time marker correlated with the time marker bit of the first trigger event entry can be stored. Content of the capture region from the trace buffer correlated time markers can be output.

REFERENCES:
patent: 6615370 (2003-09-01), Edwards et al.
patent: 6813731 (2004-11-01), Zahavi et al.
patent: 2009/0119548 (2009-05-01), Kollmann et al.
patent: 2010/0083052 (2010-04-01), Huber et al.
patent: 2011/0029823 (2011-02-01), Horley et al.
U.S. Appl. No. 12/036,920, filed Feb. 25, 2008, Ou et al.

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