Trace equivalence identification through structural...

Details Trace equivalence identification through structural... Trace equivalence identification through structural...

2008-07-08

2008-07-08

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C703S014000

Reexamination Certificate

active

11383770

ABSTRACT:
A method for performing trace equivalent identification by structural isomorphism detection, the method comprising: synthesizing a first netlist into a second netlist, the second netlist including two-input AND gates, inversions, inputs, constants, and registers; constructing a third netlist, the third netlist being a pseudo-canonical netlist that uses calls to algorithms for constructing a netlist for gate g1and for constructing a netlist for gate g2, where g1and g2are gates; and performing an isomorphism check of gates g1and g2.

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“Sequential Equivalence Checking based on Structura; Similarities”, C. A. J. van Eijk, IEEE @2000.

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