Torsional resonance mode probe-based instrument and method

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06945099

ABSTRACT:
An apparatus and method of operating a probe-based instrument in a torsional mode. The method includes providing a probe having a cantilever defining a longitudinal axis and supporting a tip. In operation, the method torsionally oscillates the probe generally about the longitudinal axis at a resonance. In addition, the method changes a separation distance between the tip and a surface of a sample so the tip interacts with the surface during data acquisition. By detecting a change in the torsional oscillation of the cantilever in response to the interaction between the tip and the surface, forces, including shear forces and shear force gradients, between the tip and the surface can be measured to determine sub-nanometer features.

REFERENCES:
patent: 5267471 (1993-12-01), Abraham et al.
patent: 5347854 (1994-09-01), Martin et al.
patent: 5386720 (1995-02-01), Toda et al.
patent: 5503010 (1996-04-01), Yamanaka
patent: 5646339 (1997-07-01), Bayer et al.
patent: 6000280 (1999-12-01), Miller et al.
patent: 6006593 (1999-12-01), Yamanaka
patent: 6100524 (2000-08-01), Yagi et al.
patent: 6552339 (2003-04-01), Gupta et al.
patent: 6590208 (2003-07-01), Massie
patent: 6694817 (2004-02-01), Degertekin et al.
patent: 2002/0121131 (2002-09-01), Mancevski et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Torsional resonance mode probe-based instrument and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Torsional resonance mode probe-based instrument and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Torsional resonance mode probe-based instrument and method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3368846

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.