Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2006-08-15
2006-08-15
Larkin, Daniel S. (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
Reexamination Certificate
active
07089787
ABSTRACT:
A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.
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International Search Report, 12 pages.
Quate Calvin F.
Sahin Ozgur
Solgaard Olav
Board of Trustees of the Leland Stanford Junior University
Cook Carmen C.
Larkin Daniel S.
Patent Law Group LLP
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