Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-22
2008-04-22
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S754090
Reexamination Certificate
active
07362119
ABSTRACT:
The present invention relates to a probe for making electrical connection to a contact pad on a microelectronic device. A foot having a length, a thickness, a width, a proximal end, and a distal end, is connected to a substrate. The length of the foot is greater than its width. A torsion bar having a length, a width, a thickness, a proximal end, and a distal end, is connected to the distal end of the foot at the proximal end of torsion bar. The torsion bar lies in a first plane. A spacer having a length, a width, and a thickness, is connected to the distal end of the torsion bar. An arm having a length, a width, a thickness, a proximal end, and a distal end is connected to said spacer at the arms proximal end. The arm lies in a second plane and the second plane is in a different plane than the first plane. A first post having a top side and a bottom side is connected to the arm near the distal end of the arm. A tip is electrically connected to the top side of the post.
REFERENCES:
patent: 3806801 (1974-04-01), Bove
patent: 4161692 (1979-07-01), Tarzwell
patent: 4214201 (1980-07-01), Kern
patent: 4719417 (1988-01-01), Evans
patent: 4899099 (1990-02-01), Mendenhall et al.
patent: 4906920 (1990-03-01), Huff et al.
patent: 5152695 (1992-10-01), Grabbe et al.
patent: 5190637 (1993-03-01), Guckel
patent: 5191708 (1993-03-01), Kasukabe et al.
patent: 5513430 (1996-05-01), Yanof et al.
patent: 5613861 (1997-03-01), Smith et al.
patent: 5665648 (1997-09-01), Little
patent: 5811982 (1998-09-01), Beaman et al.
patent: 5926951 (1999-07-01), Khandros et al.
patent: 5953306 (1999-09-01), Yi
patent: 5973394 (1999-10-01), Slocum et al.
patent: 6232669 (2001-05-01), Khoury et al.
patent: 6245444 (2001-06-01), Marcus et al.
patent: 6307392 (2001-10-01), Soejima et al.
patent: 6414501 (2002-07-01), Kim et al.
patent: 6426638 (2002-07-01), Di Stefano
patent: 6482013 (2002-11-01), Eldridge et al.
patent: 6520778 (2003-02-01), Eldridge et al.
patent: 6616966 (2003-09-01), Mathieu et al.
patent: 6727579 (2004-04-01), Eldridge et al.
patent: 6736665 (2004-05-01), Zhou et al.
patent: 6771084 (2004-08-01), Di Stefano
patent: 6791176 (2004-09-01), Mathieu et al.
patent: 6809539 (2004-10-01), Wada et al.
patent: 0567332 (1993-10-01), None
patent: WO 2004/056698 (2004-07-01), None
Bang et al, Vertical Micro-probe Design Based on the EFABTM Micro-Fabrication Process, IEEE Southwest Test Workshop 2003, pp. 1-23, Jun. 1, 2003.
Jun-Bo Yoon et al., Monolithic Integration of 3-D Electroplated Microstructures With Unlimited Number of Levels Using Planarization With A Scarificial Metallic Mold (PSMM), pp. 624 thru 629, Jan. 17, 1999.
Garabedian Raffi
Hsu Yang
Ismail Salleh
Khoo Melvin
Tang Weilong
Karlsen Ernest
Pillsbury Winthrop Shaw & Pittman LLP
Touchdown Technologies, Inc
LandOfFree
Torsion spring probe contactor design does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Torsion spring probe contactor design, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Torsion spring probe contactor design will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2746921