Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2008-01-29
2008-01-29
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07325215
ABSTRACT:
A method for developing a circuit design is disclosed. The method generally include the steps of (A) generating a violation display based on violation information provided from a place-and-route tool and (B) generating a layout display based on layout information provided from the place-and-route tool. The violation display may include (i) a plurality of performance violations for the circuit design and (ii) a plurality of user inputs each associated with one of the performance violations. The layout display may include a layout view of the circuit design. The layout view may highlight at least one of (i) a plurality of cells and (ii) a plurality of networks each along a path related to a particular one of the performance violations identified by a user through the user inputs.
REFERENCES:
patent: 5793643 (1998-08-01), Cai
patent: 6230304 (2001-05-01), Groeneveld et al.
patent: 7069528 (2006-06-01), Kovacs et al.
patent: 2003/0005398 (2003-01-01), Cho et al.
patent: 2006/0271899 (2006-11-01), Tan et al.
Dinter Matthias
Dirks Juergen
Preuthen Herbert Johannes
Chiang Jack
LSI Logic Corporation
Maiora, PC Christopher P.
Tat Binh
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