Timing skew measurement system

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000

Reexamination Certificate

active

07380230

ABSTRACT:
An improved timing skew measurement system includes a selector receiving a plurality of input signals whose relative skew is to be measured, a selection controller connected to the select inputs of the selector for selecting one of the input signals and a sequential logic element having a first input connected to the output of the selector. The system further includes a controllable clock generator capable of providing an adjustable clock edge position connected to a second input of the sequential logic element, the first and second inputs being associated by at least one defined timing relationship for correct operation of the sequential logic element, and an output analyzer having one input connected to the output of the sequential logic element, a first output connected to the input of the selection controller and a second output connected to the control input of the controllable clock generator.

REFERENCES:
patent: 5553276 (1996-09-01), Dean
patent: 6470483 (2002-10-01), Rodriguez et al.

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