Timing failure analysis in a semiconductor device having a...

Details Timing failure analysis in a semiconductor device having a... Timing failure analysis in a semiconductor device having a...

2005-07-29

2008-12-02

Duncan, Marc (Department: 2113)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S037000, C714S042000, C712S227000

Reexamination Certificate

active

07461295

ABSTRACT:
A method of testing a semiconductor device having a pipelined architecture. Operation of a first pipeline stage of the semiconductor is disabled during a first pipelined operation to establish test data at an input of a second pipeline stage of the semiconductor device. A second pipelined operation is executed to enable the second pipeline stage to generate an intermediate result using the test data. A final result of the second pipelined operation is evaluated to determine whether the second pipeline stage produced a correct intermediate result.

REFERENCES:
patent: 4755951 (1988-07-01), Hollister
patent: 5226048 (1993-07-01), Bandali et al.
patent: 5394403 (1995-02-01), Klein
patent: 5870411 (1999-02-01), Durham et al.
patent: 5912900 (1999-06-01), Durham et al.
patent: 5936977 (1999-08-01), Churchill et al.
patent: 6006347 (1999-12-01), Churchill et al.
patent: 6038658 (2000-03-01), Chow
patent: 6286118 (2001-09-01), Churchill et al.
patent: 6690595 (2004-02-01), Srinivasan et al.
patent: 6775637 (2004-08-01), Garcia
patent: 6996032 (2006-02-01), Ganry
patent: 7200793 (2007-04-01), Kengeri et al.
patent: 7353330 (2008-04-01), Waterhouse et al.
patent: 7355872 (2008-04-01), Hsu et al.
patent: 2003/0226000 (2003-12-01), Rhoades
patent: 2006/0155964 (2006-07-01), Totsuka
Xiaogang Du; Reddy, S.M.; Rayhawk, J.; Wu-Tung Cheng, “Testing delay faults in embedded CAMs,” Test Symposium, 2003. ATS 2003. 12th Asian , vol., No., pp. 378-383, Nov. 16-19, 2003.

Affiliated with

Also associated with

Rating

Timing failure analysis in a semiconductor device having a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Timing failure analysis in a semiconductor device having a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Timing failure analysis in a semiconductor device having a... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4034202