Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Patent
1997-04-02
2000-07-18
Shah, Kamini
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
714700, 327261, 327276, H03H 1126
Patent
active
060920300
ABSTRACT:
Apparatus for supplying a signal after a predetermined time delay comprises circuitry for generating a base delay signal that is synchronized to a stable master oscillator insensitive to changes in at least one environmental variable. A vernier signal delay circuit provides delay increments smaller than those available from the base delay signal, the delay increments being sensitive to said at least one environmental variable. Storage circuitry is provided for storing information related to the duration of the delay increments as function of at least one environmental variable for which correction is to be supplied. Sensing circuitry is provided for sensing the at least one environmental variable for which correction is to be provided to supply a sensed at least one environmental variable. Control signal generating circuitry is provided, responsive to the sensing means and cooperating with the storage means, for generating a control signal to the vernier signal delay means to select a desired delay from among the delay increments in response to the sensed at least one environmental variable.
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Caywood John M.
Kraus Lawrence A.
Lepejian Yervant D.
Segal Julie D.
Credence Systems Corporation
Shah Kamini
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