Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
Reexamination Certificate
2005-05-03
2005-05-03
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Error/fault detection technique
C713S401000
Reexamination Certificate
active
06889357
ABSTRACT:
Disclosed is an improved start-up/reset calibration apparatus and method for use in an SLDRAM memory device A 2Nbit calibration pattern which is based on a pseudo random sequence is used to calibrate the relative timing of data and a latching clock signal to ensure optimal operation of the memory device. In addition, during calibration of one data path, other nearby data paths may receive in phase, out of phase and/or both in phase and out of phase versions of the calibration pattern so that the data path under calibration is calibrated under conditions which more closely approximate random operating conditions.
REFERENCES:
patent: 5841580 (1998-11-01), Farmwald et al.
patent: 5917760 (1999-06-01), Millar
patent: 5953263 (1999-09-01), Farmwald et al.
patent: 6016282 (2000-01-01), Keeth
patent: 6035365 (2000-03-01), Farmwald et al.
patent: 6038195 (2000-03-01), Farmwald et al.
patent: 6067592 (2000-05-01), Farmwald et al.
patent: 6101152 (2000-08-01), Farmwald et al.
patent: 6298465 (2001-10-01), Klotchkov
patent: 6336192 (2002-01-01), Sakamoto et al.
patent: 6446180 (2002-09-01), Li et al.
patent: 6636999 (2003-10-01), Yamada
Gillingham; “SLDRAM Architectural and Functional Overview”; SLDRAM Consortium, Aug. 29, 1997, pp. 1-14.
Fuller Paul M.
Johnson Brian
Keeth Brent
Lee Terry R.
Dickstein , Shapiro, Morin & Oshinsky, LLP
Micro)n Technology, Inc.
Tu Christine T.
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