Time-series data analyzing apparatus

Details Time-series data analyzing apparatus Time-series data analyzing apparatus

2006-03-28

2008-10-14

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Time duration or rate

Reexamination Certificate

active

07437266

ABSTRACT:
A time-series data analyzing apparatus which extracts a composite factor time-series pattern from time-series data. The apparatus includes a dividing device which divides the time-series data into pattern generation time-series data and pattern inspection time-series data which do not include pattern generation time-series data. A first generating device generates a transitional pattern including a support time data indicating a transition of support time and having a transition occurrence probability higher than a minimum occurrence probability in the pattern generation time-series data. A second generating device generates frequently appearing integrated transitional patterns. A second computing device computes cause-and-effect strength of each of the frequently appearing integrated transitional patterns using the pattern inspection time-series data. A display device displays the composite factor time-series pattern having the cause-and-effect strength higher than the minimum cause-and-effect strength given preliminarily.

REFERENCES:
patent: 2006/0129554 (2006-06-01), Suyama et al.
patent: 2006/0271533 (2006-11-01), Sakurai et al.
patent: 10-198750 (1998-07-01), None
patent: 2004-21854 (2004-01-01), None
patent: 2004-348432 (2004-12-01), None
Rakesh Agrawal, et al., “Mining Sequential Patterns,” Proceedings of the 11thInternational Conference on Data Engineering, pp. 3-14 (1995).

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