4. Data processing: measuring, calibrating, or testing
  5. Measurement system
  6. Time duration or rate

Youichi Kitahara

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Sequential pattern extracting apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Time-series data analyzing apparatus

Data processing: measuring – calibrating – or testing – Measurement system – Time duration or rate
Reexamination Certificate

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Profile ID: LFUS-PAI-P-3150617

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