Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer
Reexamination Certificate
2007-09-04
2007-09-04
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
Using fiber or waveguide interferometer
Reexamination Certificate
active
10528140
ABSTRACT:
A time resolved, nonlinear complex susceptibility measuring apparatus (1) that is capable of measurement unaffected by any distortion of the wave front of a probe light whereby a temporal change in the nonlinear complex susceptibility of a nonlinear optical material that occurs when it is irradiated with a light pulse in a femtosecond range is measured using a pair of polarized lights orthogonal to each other which are formed by splitting a single light pulse into a reference and a probe light (5) and (6) in a polarized light splitting Sagnac type interference light path (8). A direction of polarization converting mechanism for rotating a direction of polarization of the reference and probe lights by an angle of 90° in the polarized light splitting Sagnac type interference light path is included to align the directions of polarization on a test specimen (3). A phase difference between the reference and probe lights which are output from the polarized light splitting Sagnac type interference light path is swept by a phase difference sweep mechanism (9) whereby a time resolved, nonlinear complex susceptibility is found from a phase difference sweep interference waveform obtained by measuring the intensity of interference light between the reference and probe lights for each of such phase differences swept.
REFERENCES:
patent: 6831749 (2004-12-01), Ohno et al.
patent: 2001-194268 (2001-07-01), None
Fumikazu Inuzuka et al.; The Japan Society of Applied Physics, vol. 63rd, No. 3, Sep. 24, 2002, p. 941, 26a-YC-10. Cited in the int'l. search rpt.
Inuzuka Fumikazu
Lang Hiroyoshi
Misawa Kazuhiko
Japan Science and Technology
Lee Hwa (Andrew)
Westerman, Hattori, Daniels & Adrian , LLP.
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