Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means
Reexamination Certificate
2009-11-13
2011-11-01
Johnston, Phillip A (Department: 2881)
Radiant energy
Ionic separation or analysis
Ion beam pulsing means with detector synchronizing means
C250S492100, C250S526000, C250S315300
Reexamination Certificate
active
08049168
ABSTRACT:
This measurement device is used to determine energy for charged particles. The measurement device includes two segments and a plate that define two thresholds or gaps. The current as a charged particle passes through these thresholds or gaps is measured. The measurement device then calculates the energy of the charged particles. Energy contamination also may be determined.
REFERENCES:
patent: 5164596 (1992-11-01), Noguchi et al.
patent: 5591969 (1997-01-01), Park et al.
patent: 5644220 (1997-07-01), Urs et al.
patent: 6137112 (2000-10-01), McIntyre et al.
patent: 7041968 (2006-05-01), Enke
patent: 7067828 (2006-06-01), Swenson
patent: 7078679 (2006-07-01), Westphall et al.
patent: 7282709 (2007-10-01), Darling et al.
patent: 2002/0070361 (2002-06-01), Mack et al.
patent: 2006/0192134 (2006-08-01), Renau et al.
patent: 2007/0257199 (2007-11-01), Gorrell et al.
patent: 2008/0073584 (2008-03-01), Callahan et al.
patent: 2008/0283778 (2008-11-01), Tomimatsu et al.
patent: 2009/0114813 (2009-05-01), Koo et al.
patent: 2006236601 (2006-09-01), None
patent: 2007019375 (2007-01-01), None
V.I. Gushenets et al., “Simple and Inexpensive Time-of-Flight Charge-to-Mass Analyzer for Ion Beam Source Characterization,” Rev. of Sci. Instrum. 77, 063301, 2006, pp. 1-3, Melville, NY, USA.
F.A. White et al., “Absolute Energy Measurement of Alpha Particles from Po210,” Physical Review, vol. 109, No. 2, Jan. 15, 1958, pp. 437-442.
V. Kanarov et al., “High Resolution Energy Analyzer for Broad Ion Beam Characterization,” Rev. of Sci. Instrum. 79, 093304, 2008, pp. 1-16, Melville, NY, USA.
I.A. Rusu et al., “Electron Plasma Parameters and Ion Energy Measurement at the Grounded Electrode in an RF Discharge,” J. Phys. D.: Appl. Phys. 35, 2002, pp. 2808-2814, IOP Publishing Ltd., UK.
Johnston Phillip A
Smyth Andrew
Varian Semiconductor Equipment Associates Inc.
LandOfFree
Time-of-flight segmented Faraday does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Time-of-flight segmented Faraday, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Time-of-flight segmented Faraday will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4304540