Time-of-flight data acquisition system

Radiant energy – Ionic separation or analysis – Ion beam pulsing means with detector synchronizing means

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250282, B01D 5944, H01J 4900

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active

057124809

ABSTRACT:
A system intended for use in time-of-flight mass spectroscopy for detecting at least one ion species in an ion spectra including a signal acquisition circuit for detecting the ions in the spectra and generating output signals indicative thereof, a sequence and storage control circuit for tagging certain ones of the signals to be stored, a memory circuit for storing the output signals tagged by the sequence and storage control circuit, and a digital signal processor circuit receiving the tagged signals from the memory for summing the tagged data and generating an output signal indicative of a value of the ion species detected. A method for collecting the data is also disclosed.

REFERENCES:
patent: 3870881 (1975-03-01), Halliday et al.
patent: 3916187 (1975-10-01), Roy
patent: 4472631 (1984-09-01), Enke et al.
patent: 4490806 (1984-12-01), Enke et al.
patent: 4970390 (1990-11-01), Szymczak
patent: 5175430 (1992-12-01), Enke et al.
patent: 5367162 (1994-11-01), Holland et al.
patent: 5463219 (1995-10-01), Buckley et al.
Holland, J.F., et al; Design, Construction, and Evaluation of an integrating transient recorder for data acquisition, Rev. Sci. Instrum. 62 (1) Jan. 1991.
Steffens, P., et al; A Time-of-Flight Mass Spectrometer for Static Sims Applications, Journal of Vacuum Science & Technology A, SEcond Series, vol. 3, No. 3; Part II, May/Jun. 1985.
Kristo, M.J., et al; System for Simultaneous Count/Current, Measurement With Dual-Mode Photon Particle Detector, Rev. Sci. Instrum. 59 (3), Mar. 1988.
Kawatoh, E., et al., Analysis of Sputtered Neutrals by Nonresonant Multiphoton Ionization Japanese Journal of Applied Physics, Mar. 1991, vol. 30, No. 3.
Hudor, A.M.; Past Electronics for Time-of-Flight Measurements, Rev. Sci. Instrum. 52(6), Jun. 1981.
Kutscher et al., A Transversally & Longitudinally Focusing Time-of-Flight Mass Spectrometer, Journal of Mass Spectrometry Ion Physics, vol. 103, p. 117 (1991).
Wiley and McLaren, Rev. Sci. Instrum., vol. 26, p. 1150 (1955).
Mamyrin et al., Soviet Physics, J.E.P.T., vol. 37, p. 45 (1973).
Benninghoven et al., Organic Mass Spectrometry, vol. 12, p. 593 (1977).
Karas et al., International Journal of Mass Spectrometry Ion Proceedings, vol. 92, p. 231 (1989).
O'Harleron et al., Technical Document Report No. ASD TDR 62 644, Parts I and II (1964).
Dodonov et al., Book of Abstracts from the Twelfth International Mass Spectrometry Conference, Amsterdam (1991).
Coles et al., Proceedings of the Forthieth ASMS Conference on Mass Spectrometry and Applied Topics vol. 10 (1992).
Boyle et al., Analytical Chemistry, vol. 64, p. 2084 (1992).
Myers and Hieftje, Michrochemical Journal (1993).
Cameron, A.E.; Eggers, D.F.: Rev. Sci. Instrum., vol. 19, p. 605 (1948).
Futrell et al., Modification of Time-of-Flight Mass Spectrometer for investigation of Ion-Molecule Reactions at Elevated Pressures, Rev. Sci. Instrum., vol. 39, No. 3, p. 340 (1968).
Miller et al., Improvement of Spectral Baseline Stability for a Time-of-Flight Mass Spectrometer Operated at Elevated Pressures, Rev. Sci. Instrum., vol. 39, No. 3, p. 503 (1969).
Studier, Martin, Continuous Ion Source for a Time-of-Flight Mass Spectrometer Rev. Sci. Instrum., vol. 34, No. 12 p. 1367 (1963).
Di Valentin and Dove, Satellite Mass Peaks in Time-of-Flight Mass Spectrometry of Ions Continuously Sampled From an External Source, International Journal of Mass Spectrometry and Ion Physics, p. 359 (1973).
Fowler and Good, A Theory on Obtaining Short Bursts of Ions from a Beam of Ions, Nuclear Instruments and Methods, vol. 7, p. 245 (1960).
Sanzone, George, Energy Resolution of the Conventional Time-of-Flight Mass Spectrometer Rev. Sci. Instrum., vol 41, No. 3, p. 741 (1970).
Pinkston et al., New Time of Flight Mass Spectrometer for Improved Mass Resolution, Versatility, Mass Spectrometry Studies, Rev. Sci. Instrum., vol. 57 (4), p. 583 (1986).
Cotter, R.G., Electrospray Ionization on a Reflecting Time-of-Fligh Mass Spectrometer, ACS Book (1994).
Gohl et al., Time-of-Flight Mass Spectrometry for Ions of Large Energy Spread, International Journal of Mass Spectrometry and Ion Physics, vol. 48, p. 411 (1983).
Boesl, et al., A High-Resolution Time-of-Flight Mass Spectrometer with Laser Desorptioin and a Laser Ionization Source, Analytical Instrumentation, vol. 16(1), p. 151 (1987).
Bakker, J. M. B., A Beam-Modulated Time-of-Flight Mass Spectrometer; Part I: Theoretical Considerations, Scientific Instruments, vol. 6, NO. 8, p. 677 (1973).
Mamyrin and Shmikk, The Linear Mass Reflection, Soviet physics, J.E.P.T., vol. 49(5) (1979).
Bakker, J.M.B., A Beam-Modulated Time-of-Flight Mass Spectrometer; Part II: Expiremental Work, Scientific Instruments, vol. 7, No. 5, p. 364 (1974).
Yefchak et al., Beam Deflection for Temporal Encoding in Time-of-Flight Mass Spectrometry, Journal of American Society for Mass Spectrometry, vol. 1 No. 6 (1990).
Ma, C. et al., The Design of an Atmospheric Pressure Ionization/Time-of-Flight Mass Spectrometer Using a beam Deflection Method, Rev. Sci. Instrum., vol. 63, p. 139 (1992).
Van Breemen et al., Time-Resolved Laser Desorption Mass Spectrometry, Journal of Mass Spectrometry and Ion Physics, vol. 49, No. 1 (1983).
Olthoff et al., Liquid Secondary Ion Time-of-Flight Mass Spectrometry, Analytical Chemistry, (1987).
Bergmann et al., High-Resolution Time-of-Flight Mass Spectrometer, Rev. Sci. Instrum., vol. 60, No. 4 (1989).
Grix, et al., A Time-of-Flight Mass Analyzer wityh High Resolving Power, Physikalisches Institut der Justus-Liebig-Universitat, West Germany (1988).
Karataev et al., New Method for Focusing Ion Bunches in Time-of-Flight Mass Spectrometers, Soviet Physics-Technical Physics, vol. 16 No. 7 (1972).
Bakker, J.M.B., The Time-Focusing Principle: A Double-Focusing Design for Time-of-Flight Mass Spectrometers, Journal of Mass Spectrometry and Ion Physics, vol. 6 No. 314 (1971).
Poschenrieder, W.P., Multiple-Focusing Time-of-Flight Mass Spectrometers Part II: TOFMS with Equal Energy Acceleration, Journal of Mass Spectrometry and Ion Physics, vol. 9, No. 4 (1972).
Kinsel and Johnston, Post Source Pulse Focusing: A Simple Method to Achieve Improved Resolution in a Time-of-Flight Mass Spectrometer, Int'l Journal of Mass Spectrometry and Ion Processes, vol. 91 (1989).
Dawson and Guilhaus, Orthogonal-Acceleration Time-of-Flight Mass Spectrometer, Rapid Communications in Mass Spectrometry, vol. 3, No. 5 (1989).
Li, G., Myers, D.P., and Hieftje, G.M., Ion Optical Considerations and Design of a Time-of-Flight Mass Spectrometer for Sampling Ions from an Atmospheric Pressure Ionization Source.
Dodonov et al., Electrospray Ionization on a Reflecting Time-of-Flight Mass Spectrometer, ACS Book (1993).
Houk, R.S., Anal. Chem., vol. 58, No. 1, p. 97A (1986).
Green, L.W., Macdonald, R.G., and Sopchyshyn, F.C.; Fast-Pulse Detection for Isotoic Abundance Determination by Resonance Ionization, Time-of-Flight Mass Spectrometry, Analytical Instrumentation, 17(1&2), 195-214 (1988).

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