Error detection/correction and fault detection/recovery – Pulse or data error handling – Skew detection correction
Reexamination Certificate
2006-06-12
2010-12-07
Chung, Phung M (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Skew detection correction
C714S699000
Reexamination Certificate
active
07849371
ABSTRACT:
In measuring a certain time lag between generations of two pulse signals, a time lag measuring device prevents errors in measurement results even with an error in two reference signals for measuring the time lag. The device measures a time lag between a start signal M1and a stop signal M2and includes a reference signal generating section41generating two reference signals S1, S2having a phase difference π/2, and an amplitude detecting section42detects amplitudes A11, A12and A21, A22of the reference signals S1, S2at generation timings for the start signal M1and the stop signal M2, a phase difference detecting section43calculating a phase _ of the reference signals S according to each set of the amplitudes (A11, A12) and (A21, A22), and a correcting section46correcting the calculated phase using correction data for error correction in the reference signals S1, S2.
REFERENCES:
patent: 4560271 (1985-12-01), Fumio
patent: 5075878 (1991-12-01), Ohtomo et al.
patent: 5218289 (1993-06-01), Besson
patent: 5566139 (1996-10-01), Abshire
patent: 5956374 (1999-09-01), Iwamatsu
patent: 7102306 (2006-09-01), Hamaoka et al.
patent: 7202451 (2007-04-01), Uchida et al.
patent: 7230216 (2007-06-01), Uchida et al.
patent: 7660212 (2010-02-01), Takeda
patent: 2006/0082339 (2006-04-01), Hamaoka et al.
patent: 2009/0122296 (2009-05-01), Ohishi et al.
patent: 0 348 898 (1990-01-01), None
patent: 1 321 740 (2003-06-01), None
patent: 1 808 671 (2005-09-01), None
patent: 62-063885 (1987-03-01), None
patent: 63-085489 (1988-04-01), None
patent: 2-077673 (1990-03-01), None
patent: 5-231879 (1993-09-01), None
patent: 8-122465 (1996-05-01), None
patent: 2916780 (1999-07-01), None
patent: WO 2006/038559 (2006-04-01), None
European Patent Office, Extended European Search Report for European Patent Application No. EP 06 75 7252, Nov. 11, 2009. European Patent Office. Rijswijk, Netherlands.
Ohishi Masahiro
Ohtomo Fumio
Tokuda Yoshikatsu
Chapman and Cutler LLP
Chung Phung M
Kabushiki Kaisha Topcon
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