Three dimensionally stacked non volatile memory units

Static information storage and retrieval – Systems using particular element – Resistive

Reexamination Certificate

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Details

C365S145000, C365S163000, C365S171000, C257S211000, C257S686000, C257SE21614, C257SE23085

Reexamination Certificate

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08054673

ABSTRACT:
A memory unit including a first transistor spanning a first transistor region in a first layer of the memory unit; a second transistor spanning a second transistor region in a second layer of the memory unit; a first resistive sense memory (RSM) cell spanning a first memory region in a third layer of the memory unit; and a second RSM cell spanning a second memory region in the third layer of the memory unit, wherein the first transistor is electrically coupled to the first RSM cell, and the second transistor is electrically coupled to the second RSM cell, wherein the second layer is between the first and third layers, wherein the first and second transistor have an transistor overlap region, and wherein the first memory region and the second memory region do not extend beyond the first transistor region and the second transistor region.

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PCT Search Report and Written Opinion dated Sep. 20, 2010.

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