Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-03-13
2010-02-23
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07669152
ABSTRACT:
Apparatus, systems, and methods are provided for processing integrated circuit chip design. A three-dimensional Monte Carlo random-walk process may be applied to a cell in a hierarchical description of the layout of the chip to extract information regarding the cell. The information may include coupling resistance, capacitance, inductance, or combinations thereof. A neighborhood of the cell may be built and data correlated to the neighborhood may be stored. Such a technique may be applied from a bottom level to a top level of the hierarchical description of the chip layout.
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Feinberg Yuri
Tcherniaev Andrei
Chiang Jack
Memula Suresh
Schwegman Lundberg & Woessner, P.A.
Silicon Frontline Technology Inc.
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