Thiopyran derivative, polymer, resist composition, and...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

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C430S326000, C430S910000

Reexamination Certificate

active

08080365

ABSTRACT:
To provide a thiopyran derivative, having a structure expressed by the following general formula 1:where X is O or S; R1is —H, —CH3, C2-4 alkyl group, thioether group, or ketone group; R2is —H, —CH3, or trifluoromethyl group; and R1and R2may be identical to or different from each other.

REFERENCES:
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patent: 2005/0049325 (2005-03-01), Chisholm et al.
patent: 2005/0049376 (2005-03-01), Chisholm et al.
patent: 2005/0214674 (2005-09-01), Sui et al.
patent: 2008/0009647 (2008-01-01), Hatakeyama et al.
patent: 09-110790 (1997-04-01), None
patent: 2005-133071 (2005-05-01), None
patent: 2006-089412 (2006-04-01), None
patent: 2006-033359 (2006-03-01), None
International Search Report of PCT/JP2007/074128, Mailing Date of Jan. 22, 2008.
Blakey et al, “Novel High-Index Resists for 193 nm Immersion Lithography and Beyond”, Proc. of SPIE, 2007, p. 651909-1-9, vol. 6519, cited in spec.
J. Heijboer et al, “Study of the Molecular Movement of Oxa- and Thiacyclohexyl Rings in Solid Polymers by Mechanical Measurements over a Broad Frequency Range”, Journal of Macromolecular Science—Physics, Jun. 1971, p. 375-392, cited in spec.

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