Coating processes – Optical element produced
Reexamination Certificate
2007-03-20
2007-03-20
Meeks, Timothy (Department: 1762)
Coating processes
Optical element produced
C427S255310, C427S255700, C427S419300, C427S374200, C427S398100
Reexamination Certificate
active
10607912
ABSTRACT:
A thin layer of hafnium oxide or stacking of thin layers comprising hafnium oxide layers for producing surface treatments of optical components, or optical components, in which at least one layer of hafnium oxide is in amorphous form and has a density less than 8 gm/cm3. The layer is formed by depositing on a substrate without energy input to the substrate.
REFERENCES:
patent: 5339326 (1994-08-01), Tsujimura et al.
patent: 5399435 (1995-03-01), Ando et al.
patent: 5494743 (1996-02-01), Woodard et al.
patent: 5623375 (1997-04-01), Floch et al.
patent: 5670248 (1997-09-01), Lazarov et al.
patent: 5691044 (1997-11-01), Oyama et al.
patent: 6077569 (2000-06-01), Knapp et al.
patent: 6319730 (2001-11-01), Ramdani et al.
patent: 0 486 475 (1989-03-01), None
patent: 60-064326 (1985-04-01), None
“Influence of Microstructure on Laser Damage Threshold of IBS Coatings” by C.J. Stolz et al SPIE vol. 2714 XP-002111763, pp. 351-359.
“Thin Films for Optical Systems” edited by F.R. Flory Ecole Nationale Superleure de Physique de Marseille, Marseille, France pp. 521-549.
“Optical Coatings Deposited by Reactive Ion Plating” by A.J. Waldorf et al Applied Optics/Oct. 1, 1993/vol. 32, No. 28 pp. 5583-5593.
“Optical Coatings for High-Power Neodymium Lasers” by B. Brauns et al Sov. J. Quantum Electron 18 (10) Oct. 1988, c 1989 American Institute of Physics pp. 1286-1290.
“Investigation of Optical Damage Mechanisms in Hafnia and Silica Thin Films Using Pairs of Subnanosecond Laser Pulses with Variable Time Delay” by L.L. Chase, et al J. Appl. Phys. 71 (3) Feb. 1, 1992/American Institute of Physics pp. 1204-1208.
“Characterization of Defect Geometries in Multilayer Optical Coatings” by R.J. Tench et al J. Vac. Sci. Technol. A 12(5), Sep./Oct. 1994 1994 American Vacuum Society pp. 2808-2813.
“Reactive Evaporation of Low-Defect Density Hafnia” by R.Chow et al Applied Optics/ Oct. 1, 1993/vol. 32, No. 28/ pp. 5567-5574.
“Stress and Environmental Shift Characteristics of Hf02/Si)2 Multilayer Coatings” by J.F. Anzellotti et al Proceedings Reprint/SPIE—The International Society for Optical Engineering Reprinted from 28th Annual Boulder Damage Symposiumproceedings “Laser-Induced Damage in Optical Materials: 1996” Oct. 7-9, 1996, Boulder, Colorado SPIE vol. 2966, pp. 258-264.
“Study of the Structure and Properties of Thick Vacuum Condensates of Nickel, Titanium, Tungsten, Alumnium Oxide and Zirconium Dioxide” by B.A. Movchan et al F metal.metalloved., No. 4, 653-660, 1969 pp. 83-90.
“Nano Absorbing Centers: A Key Point in Laser Damage of Thin Films” by J. Dijon et al SPIE vol. 2966, pp. 315-325.
Andre Bernard
Dijon Jean
Rafin Brigitte
Commissariat a l''Energie Atomique
Hayes & Soloway P.C.
Markham Wesley D.
Meeks Timothy
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