Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-20
2007-02-20
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
Reexamination Certificate
active
11018966
ABSTRACT:
A thin film transistor liquid crystal display (TFT-LCD) source driver for implementing a self burn-in test and a self burn-in test method are provided. The TFT-LCD source driver includes a self burn-in signal generator that generates a self burn-in signal and a burn-in load signal, a burn-in data generator that generates a burn-in data signal and a burn-in polarity control signal in response to the self burn-in signal and a clock signal. The TFT-LCD source driver also includes first and second switching units. The first switching unit transmits the burn-in load signal as an internal load signal, transmits the burn-in data signal as an internal digital data signal, and transmits the burn-in polarity control signal as an internal polarity control signal, in response to activation of the self burn-in signal. The second switching unit transmits outputs of output drivers to all channels of the TFT-LCD source driver in response to the internal load signal.
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English Abstract Only.
Jeon Yong-Weon
Kim Kyung-Wol
F. Chau & Associates LLC
Nguyen Ha Tran
Nguyen Tung X.
Samsung Electronics Co,. Ltd.
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