Thin film transistor and method of producing thin film...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C438S099000, C438S311000, C438S781000, C257SE21007, C257SE21051, C257SE21077, C257SE21128, C257SE21264, C257SE21266, C257SE21320, C257SE21324, C257SE21411

Reexamination Certificate

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08030139

ABSTRACT:
A method of producing a thin film transistor includes a gate electrode formation step that forms a gate electrode on a substrate, a gate insulating layer formation step that forms a gate insulating layer on the substrate in such a manner as to cover the gate electrode formed in the gate electrode formation step, a source/drain electrodes formation step that forms a source electrode and a drain electrode on the gate insulating layer, and a semiconductor layer formation step that applies an aqueous solution for semiconductor layer formation which is an aqueous solution comprising at least a single wall carbon nanotube and a surfactant between the source electrode and the drain electrode formed in the source/drain electrodes formation step by a coating process to form a semiconductor layer comprising the single wall carbon nanotube.

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Tanaka, Satoshi et al., 10p-R-14 “Field-Effect Transistors Using Highly Dispersed Carbon Nanotubes/Polymer Composite Films Using an Ultracentrifuge”, p. 1174, Extended Abstracts (The 66th Autumn Meeting, 2005), The Japan Society of Applied Physics No. 3, Sep. 7, 2005.

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