Thin film transistor and method for fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438159, H01L 21336

Patent

active

059151730

ABSTRACT:
Disclosed is a thin film transistor formed on a substrate, comprising a patterned gate electrode formed on said substrate; a channel layer formed around said gate electrode with a gate insulating layer interposed therebetween; a interlayer insulating layer formed on said channel layer; and source and drain electrodes formed on both side walls of said channel layer and on both side portions of said interlayer insulating layer, and isolated from each other. Each of the channel and source/drain layers is composed of polysilicon with impurity ions. In the thin film transistor, because each of the source and drain electrodes is formed relatively thicker than the channel layer, them can be significantly reduced in resistance.

REFERENCES:
patent: 4727044 (1988-02-01), Yamazaki
patent: 4951113 (1990-08-01), Huang et al.
patent: 5037766 (1991-08-01), Wang
patent: 5053347 (1991-10-01), Wu
patent: 5198379 (1993-03-01), Adan
patent: 5340999 (1994-08-01), Takeda et al.
patent: 5366909 (1994-11-01), Song et al.
patent: 5455182 (1995-10-01), Nishimoto et al.
patent: 5488005 (1996-01-01), Han et al.
patent: 5840602 (1998-11-01), Han et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin film transistor and method for fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin film transistor and method for fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film transistor and method for fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1715192

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.