Thin film silicon-on-insulator transistor having an improved pow

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257339, 257343, 257618, 257347, H01L 2910

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057809003

ABSTRACT:
A thin film transistor of SOI (Silicon-On-Insulator) type includes a buried oxide layer formed on a semiconductor substrate, a silicon layer of a first conductive type formed on the buried oxide layer, and an upper oxide layer formed on the silicon layer. The silicon layer has a body region of a second conductive type, source region of the first conductive type, drain region of the first conductive type, and a drift region of the first conductive type. The silicon layer is formed with a first portion of a thickness T1 in which the doping region is formed, and a second portion of a thickness T2 in which the body region is formed to reach the buried oxide layer. When the thicknesses T1 and T2 are determined so as to satisfy the relationships:

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