Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Reexamination Certificate
2006-06-30
2010-06-29
Tran, Minh-Loan T (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
C257S048000, C257S072000, C257SE23011, C257SE23143, C257SE23145, C257SE23179, C257SE21521, C257SE23168, C257SE23169, C257SE21524, C257SE23170, C257SE27100, C257SE27116, C349S139000, C349S143000, C349S149000, C349S192000, C349S054000
Reexamination Certificate
active
07745823
ABSTRACT:
A thin film panel is provided, which includes a first signal line and a second signal line crossing the first signal line and formed on a different layer from the first signal line. The second signal line includes an expansion having an enlarged area and at least one cutout, and is disposed adjacent to a crossing region where the second signal line crosses the first signal line.
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Innovation Counsel LLP
Lopez Fei Fei Yeung
Samsung Electronics Co,. Ltd.
Tran Minh-Loan T
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