Thin film panel and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S048000, C257S072000, C257SE23011, C257SE23143, C257SE23145, C257SE23179, C257SE21521, C257SE23168, C257SE23169, C257SE21524, C257SE23170, C257SE27100, C257SE27116, C349S139000, C349S143000, C349S149000, C349S192000, C349S054000

Reexamination Certificate

active

07745823

ABSTRACT:
A thin film panel is provided, which includes a first signal line and a second signal line crossing the first signal line and formed on a different layer from the first signal line. The second signal line includes an expansion having an enlarged area and at least one cutout, and is disposed adjacent to a crossing region where the second signal line crosses the first signal line.

REFERENCES:
patent: 5473261 (1995-12-01), Marumoto et al.
patent: 6287899 (2001-09-01), Park et al.
patent: 6404473 (2002-06-01), Kaneko et al.
patent: 2004/0022044 (2004-02-01), Yasuoka et al.
patent: 2004/0095549 (2004-05-01), Moon
patent: 2004/0119925 (2004-06-01), Moon
patent: 2005/0092995 (2005-05-01), Yoo et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin film panel and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin film panel and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film panel and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4193699

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.