Thin film magnetic memory device having redundant configuration

Static information storage and retrieval – Systems using particular element – Magnetic thin film

Reexamination Certificate

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Details

C365S158000, C365S200000, C365S210130, C365S225500, C365S066000

Reexamination Certificate

active

07110288

ABSTRACT:
Normal memory cells are arranged in rows and columns, and dummy memory cells are arranged to form dummy memory cell rows by sharing memory cell columns with the normal memory cells. When there is at least one defect in the normal memory cells and/or the dummy memory cells, replacement/repair is carried out using a redundant column in a unit of memory cell column. The redundant column includes not only spare memory cells for repair of the normal memory cells but also spare dummy memory cells for repair of the dummy memory cells.

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