Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-08-09
2011-08-09
Toledo, Fernando L (Department: 2895)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S043000, C438S104000
Reexamination Certificate
active
07994579
ABSTRACT:
The present invention provides a thin film field-effect transistor comprising a substrate having thereon at least a gate electrode, a gate insulating film, an active layer, a source electrode, and a drain electrode, wherein the active layer is an oxide semiconductor layer, a resistance layer having an electric conductivity that is lower than an electric conductivity of the active layer is provided between the active layer and at least one of the source electrode or the drain electrode, and an intermediate layer comprising an oxide comprising an element having a stronger bonding force with respect to oxygen than that of the oxide semiconductor in the active layer is provided between the active layer and the resistance layer.
REFERENCES:
patent: 2006/0038242 (2006-02-01), Hsu et al.
patent: 2006/0244107 (2006-11-01), Sugihara et al.
patent: 2008/0191204 (2008-08-01), Kim et al.
patent: 2010/0038641 (2010-02-01), Imai
patent: 2010/0163863 (2010-07-01), Yaegashi
patent: 2006-165529 (2006-06-01), None
patent: 2008-53356 (2008-03-01), None
patent: 2008-166716 (2008-07-01), None
Corresponding EPO Official communication, Dec. 10, 2009.
IDW/AD' 05, pp. 845-846 (Dec. 6, 2005).
Nature, vol. 432, pp. 488-492 (Nov. 25, 2004).
FUJIFILM Corporation
Solaris Intellectual Property Group, PLLC
Toledo Fernando L
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