Thin film device and a method for fabricating the same

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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4302761, 4302781, 430314, 430324, 428209, 428457, 428469, 428471, 428620, G03F 730, G03F 711

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056609710

ABSTRACT:
A thin film device includes a substrate, a conductive oxide film formed on the substrate, and a metal film formed on the substrate and in contact with at least a part of the conductive oxide film. The metal film includes aluminum and a metallic material. The metallic material has a standard electrode potential higher than the standard electrode potential of the aluminum so that the standard electrode potential of the metal film is higher than the reduction potential of the conductive oxide film.

REFERENCES:
patent: 4372809 (1983-02-01), Grewal et al.
patent: 4420504 (1983-12-01), Cooper et al.
patent: 5150233 (1992-09-01), Enomoto et al.
patent: 5296653 (1994-03-01), Kiyota et al.
H. Nishino et al., "Anti-Corrosion Process for Al-ITO System with Electrolytic Development Solution," Sharp Giho, No. 44, pp. 31-36 (Mar. 1990).

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