Thickness measurement instrument with memory storage of multiple

Details Thickness measurement instrument with memory storage of multiple Thickness measurement instrument with memory storage of multiple

1977-04-07

1979-05-15

Smith, Alfred E.

Radiant energy

Inspection of solids or liquids by charged particles

Including a radioactive source

250252, G01N 2300, G01D 1800

Patent

active

041550099

ABSTRACT:
An improved backscatter instrument for the nondestructive measurement of coatings on a substrate. A memory having selectable memory areas, each area having stored intelligence available which is determinative of the shape of a functional plot of coating thickness versus backscatter counts per minute unique for each particular combination of emitting isotope, substrate material, coating material and physical characteristics of the measuring instrument. A memory selector switch connects a selected area of memory to a microprocessor operating under program control whereby the microprocessor reads the intelligence stored at the selected area and converts the backscattered count of the coating being measured into indicia of coating thickness.

REFERENCES:
patent: 3854042 (1974-12-01), Ott
patent: 4047029 (1977-09-01), Allport

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