Thermal imaging method and apparatus

Details Thermal imaging method and apparatus Thermal imaging method and apparatus

2005-05-24

2008-09-02

Verbitsky, Gail (Department: 2855)

Thermal measuring and testing

Leak or flaw detection

With heating or cooling of specimen for test

C374S007000, C374S120000, C250S330000, C250S341600

Reexamination Certificate

active

07419298

ABSTRACT:
An inspection apparatus includes a light source positioned to direct light to a first surface of a workpiece. An infrared detector is positioned to receive radiation from the first surface. A data acquisition and processing computer is coupled to the light source and the infrared detector. The computer triggers the light source to emit the light a number of instances. The computer acquires thermal data from the infrared detector for a number of times after each of the instances. The computer is configured to process the data using a theoretical solution to analyze the thermal data based upon an average of the thermal data for a number of each of corresponding ones of the times from different ones of the instances.

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