Testmode to increase acceleration in burn-in

Details Testmode to increase acceleration in burn-in Testmode to increase acceleration in burn-in

2006-05-23

2006-05-23

Nguyen, Viet Q. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S230030, C365S230060, C365S189040

Reexamination Certificate

active

07050342

ABSTRACT:
A method and apparatus for simultaneously accessing multiple array blocks in a static random access memory (SRAM) device. During testing of the SRAM device, each memory cell in each memory array block is accessed to ensure proper functionality. By providing logic gates on each SRAM device, the testing can be accelerated by writing to multiple array blocks at the same time, rather than in series.

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