Testing method of head element and magnetic recording and...

Details Testing method of head element and magnetic recording and... Testing method of head element and magnetic recording and...

2011-01-18

2011-01-18

LeDynh, Bot L (Department: 2858)

Electricity: measuring and testing

Magnetic

Magnetic information storage element testing

C324S252000

Reexamination Certificate

active

07872471

ABSTRACT:
Provided is a method for testing a head element that enables proper evaluation of the head element based on a characteristic of the head element under high-temperature and high-stress conditions. The testing method can be performed on a thin-film magnetic head including a head element and a heating element capable of applying a heat and stress to the head element, or performed on a row bar or a substrate wafer on which a plurality of the head elements and a plurality of the heating elements are disposed. The testing method comprises the steps of: causing the heating element to generate heat to apply a heat and stress to the head element; and measuring a characteristic of the head element under the heat and stress to evaluate the head element.

REFERENCES:
patent: 5991113 (1999-11-01), Meyer et al.
patent: A 06-084116 (1994-03-01), None
patent: A 2002-133621 (2002-05-01), None
Uesugi, Takumi et al., U.S. Appl. No. 11/753,836, filed May 25, 2007.

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